Direct measurement of the dielectric frame rotation of monoclinic crystals as a function of the wavelength - Université Pierre et Marie Curie Access content directly
Journal Articles Optical Materials Express Year : 2014

Direct measurement of the dielectric frame rotation of monoclinic crystals as a function of the wavelength

Abstract

We report a method based on Malus' law to directly measure the dielectric frame orientation of monoclinic crystals with an accuracy of 0.3°. This technique was validated by the study of Nd3+:YCa4O(BO3)3, Sn2P2S6, BiB3O6 and Eu3+:Y2SiO5
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hal-00931889 , version 1 (14-05-2024)

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Christian Traum, Patricia Loren-Inacio, Corinne Felix, Patricia Segonds, Alexandra Pena, et al.. Direct measurement of the dielectric frame rotation of monoclinic crystals as a function of the wavelength. Optical Materials Express, 2014, 4 (1), pp.57-62. ⟨10.1364/OME.4.000057⟩. ⟨hal-00931889⟩
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